{"id":19,"date":"2017-07-07T20:21:08","date_gmt":"2017-07-07T20:21:08","guid":{"rendered":"http:\/\/utsaengineer.wpengine.com\/faculty-page-example\/?page_id=19"},"modified":"2024-05-25T20:59:05","modified_gmt":"2024-05-26T01:59:05","slug":"facility","status":"publish","type":"page","link":"https:\/\/ceid.utsa.edu\/MeMDRL\/facility\/","title":{"rendered":"Facility"},"content":{"rendered":"

Dielectric Characterization<\/strong> – LCR Meter, Network Analyzer, D33 Meter,<\/p>\n

Additive Manufacturing Deposition<\/strong> – Dimatix DMP 2835, Ceradrop F-Serie Modular Additive Deposition System with 3 inkjet deposition units, Optomec Aerosoljet Unit, UV Lamp and Near Infrared lamp, Laser profilometer, Platen Heating<\/p>\n

Spectroscopy<\/strong> – UV-Vis Spectroscopy, Fourier Transform Infrared Spectroscopy<\/p>\n

Materials Characterization<\/strong> – X-Ray Diffraction<\/p>\n

Imaging<\/strong> – Scanning Electron Microscopy<\/p>\n","protected":false},"excerpt":{"rendered":"

Dielectric Characterization – LCR Meter, Network Analyzer, D33 Meter, Additive Manufacturing Deposition – Dimatix DMP 2835, Ceradrop F-Serie Modular Additive Deposition System with 3 inkjet deposition units, Optomec Aerosoljet Unit, UV Lamp and Near Infrared lamp, Laser profilometer, Platen Heating Spectroscopy – UV-Vis Spectroscopy, Fourier Transform Infrared Spectroscopy Materials Characterization – X-Ray Diffraction Imaging – … <\/p>\n

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