Dielectric Characterization – LCR Meter, Network Analyzer, D33 Meter,

Additive Manufacturing Deposition – Dimatix DMP 2835, Ceradrop F-Serie Modular Additive Deposition System with 3 inkjet deposition units, Optomec Aerosoljet Unit, UV Lamp and Near Infrared lamp, Laser profilometer, Platen Heating

Spectroscopy – UV-Vis Spectroscopy, Fourier Transform Infrared Spectroscopy

Materials Characterization – X-Ray Diffraction

Imaging – Scanning Electron Microscopy